CIANFLONE PORTASPEC

WDXRF - XRF - Coating Thickness

 

Brand: CIANFLONE
Product: PORTASPEC

Description:

Portaspec 2501XBT

WDXRF spectrometer sequential multi-element counter.
Multi-element analyzer to fuorescenza of dispersive X-ray wavelength, sequentially.
Analytical range from Titanium to Silver and Barium Uranium.
Specifically for determining the thickness of chromium, nickel, zinc and titanium-based iron, galvanized iron and aluminum.

Prepared for the analysis of solid samples.

Diameter sample:
Maximum 64 mm - 30 mm minimum

Sample thickness:
27 mm maximum
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Gallery: