SEEC - surface-enhanced ellipsometric contrast microscopy




N-Lab Station is a powerful instrument which combines live surface interactions and topographic characterization.
It is a revolutionary analytical system, based on SEEC technique, which is a label free quantitative imaging technique for imaging, surface interactions studies and topographic analysis at the nanoscale.
The underlying idea is that, for infinitesimal amounts of material assuming the shape of nano-objects or nanofilms to become optically detectable, one should get rid of the light reflected off of the substrate surface that, otherwise, would mask what little reflected light comes from the nanometre scale sample.
The SEEC technique implements unique optical sensitive sensors (SEEC sensors) for sample detection and a proprietary algorithm (Q-SEEC) for quantitative measurements.
SEEC Sensors have a unique property to preserve the polarization state of the light after surface reflection. Any nanometric sample deposited on the SEEC sensor leads to a modification of the polarization of the light, rendering it visible.
Q-SEEC Algorithm enables the determination of the sample thickness.

It exploits the evolution of RGB components created by light interference to convert each image pixel into a thickness value.

Application Areas

- Life Science
- Materials
- Cell & Molecular Biology (Immunology, Protein, Lipids, Cells/Bacteria)
- Pharmaceutical & Diagnostics (Molecular Screening, Lipid membranes and Vescicles, Biosensors, Drug discovery)
- Medical Devices & Biomaterials (Surface coating, Physiological Interactions)
- Cleaning and Surfactants (Amphiphilic molecules, Enzimes and Biofilms)
- Thin films and coating (Polymer thin films, Self Assembled Monolayers, Polyelectrolytes)
- Nanopatterning (Microspotting, Nanolithography)
- Nano-objects (Nanoparticle interactions, Toxicology, Environment)
- Energy & Electronic (Conductive kayers, nanotubes, oil and gas)

Unique benefits of N-Lab system are as follows:

- Fully automated system
- Multiplex surface interactions
- Live nanoscale imaging
- Wide field topography analysis
- Multimode of analysis
- Microfluidic compatibility